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Smooth-disorder Effects in Ballistic Microstructures

Richter, Klaus and Ullmo, Denis and Jalabert, Rodolfo A. (1996) Smooth-disorder Effects in Ballistic Microstructures. Physical Review B 54 (8), R5219-R5222.

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Other URL: http://link.aps.org/abstract/PRB/v54/pR5219


Abstract

We analyze the effect of weak residual disorder in microstructures defined on high-mobility heterojunctions, where the classical electron motion is ballistic. We parameterize the disorder by its correlation length {\it xi} and the elastic mean free path {\it l}, which can be estimated from microscopic models. For the experimentally relevant case in which {\it xi} is not negligible with ...

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Item Type:Article
Date:August 1996
Institutions:Physics > Institute of Theroretical Physics > Chair Professor Richter > Group Klaus Richter
Identification Number:
ValueType
10.1103/PhysRevB.54.R5219DOI
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Timo Hartmann
Deposited On:20 Mar 2007
Last Modified:13 Mar 2014 09:55
Item ID:1435
Owner Only: item control page
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