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Scanning Raman spectroscopy of graphene antidot lattices: Evidence for systematic p-type doping

Heydrich, Stefanie and Hirmer, Michael and Preis, C. and Korn, Tobias and Eroms, Jonathan and Weiss, Dieter and Schüller, Christian (2010) Scanning Raman spectroscopy of graphene antidot lattices: Evidence for systematic p-type doping. Applied Physics Letters 97, 043113.

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Abstract

We have investigated antidot lattices, which were prepared on exfoliated graphene single layers via electron-beam lithography and ion etching, by means of scanning Raman spectroscopy. The peak positions, peak widths, and intensities of the characteristic phonon modes of the carbon lattice have been studied systematically in a series of samples. In the patterned samples, we found a systematic ...

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Item Type:Article
Date:30 July 2010
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller
Projects:GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Classification:
NotationType
63.22.Rc, 81.05.ue, 78.30.AmPACS
Keywords:doping, electron beam lithography, graphene, phonons, Raman spectra, sputter etching
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Claudia Rahm
Deposited On:11 Aug 2010 10:05
Last Modified:13 Mar 2014 13:56
Item ID:16081
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