Heydrich, Stefanie and Hirmer, Michael and Preis, C. and Korn, Tobias and Eroms, Jonathan and Weiss, Dieter and Schüller, Christian (2010) Scanning Raman spectroscopy of graphene antidot lattices: Evidence for systematic p-type doping. Applied Physics Letters 97, 043113.
We have investigated antidot lattices, which were prepared on exfoliated graphene single layers via electron-beam lithography and ion etching, by means of scanning Raman spectroscopy. The peak positions, peak widths, and intensities of the characteristic phonon modes of the carbon lattice have been studied systematically in a series of samples. In the patterned samples, we found a systematic ...
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|Date:||30 July 2010|
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss|
Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller
|Projects:||GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis|
|Keywords:||doping, electron beam lithography, graphene, phonons, Raman spectra, sputter etching|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited On:||11 Aug 2010 10:05|
|Last Modified:||13 Mar 2014 13:56|