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Sammynaiken, R. and Naftel, S. J and Sham, T. K. and Cheah, K. W. and Averboukh, B. and Huber, Rupert and Shen, Y. R. and Qin, G. G. and Ma, Z. C. and Zong, W. H. (2002) Structure and electronic properties of SiO₂/Si multilayer superlattices: Si K edge and L₃,₂ edge x-ray absorption fine structure study. Journal of Applied Physics 92 (6), pp. 3000-3006.