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- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.10009
Alternative Links zum Volltext:DOI
Zusammenfassung
We present a micro-Raman study of short-period [001] Si/Ge superlattices. The submicron spatial resolution of this technique enables in-plane scattering geometries, thus overcoming the severe limitations of conventional Raman set-ups for backscattering from the growth surface, where only longitudinal modes can be observed. We were able to study the complete phonon spectrum consisting of confined ...
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