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Degradation Analysis of InGaN Laser Diodes

Kümmler, V., Brüderl, G., Bader, S., Miller, S., Weimar, A., Lell, A., Härle, V., Schwarz, Ulrich, Gmeinwieser, Nikolaus and Wegscheider, Werner (2002) Degradation Analysis of InGaN Laser Diodes. physica status solidi a 194 (2), pp. 419-422.

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Abstract

The current status of InGaN-MQW-laser diodes developed at Osram OS is presented. These lasers are grown on n-conducting SiC, enabling a vertical current path, cleaved facets and excellent heat spreading. The temperature rise during cw operation is measured for different mountings. A p-side up mounted diode with thermal resistance of 18 K/W showed 143 h of cw lasing at 1 mW optical power (T = 25 ...

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Item type:Article
Date:4 December 2002
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1002/1521-396X(200212)194:2<419::AID-PSSA419>3.0.CO;2-BDOI
Classification:
NotationType
42.55.Px; 78.45.+h; 78.60.FiPACS
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Item ID:11319
Owner only: item control page

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