Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

DOI zum Zitieren dieses Dokuments:: 10.5283/epub.11480

Vancura, T. ; Kicin, S. ; Ihn, Thomas ; Ensslin, Klaus ; Bichler, Max ; Wegscheider, Werner

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Veröffentlichungsdatum dieses Volltextes: 15 Dez 2009 08:58

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A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in a Ga[Al]As heterostructure. At different separations between atomic force microscope tip and sample, a dc voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. ...