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High-Resolution Imaging of Twin Intersections in Si/Ge Superlattices on Ge(001) Substrates
Wegscheider, Werner, Eberl, Karl, Abstreiter, Gerhard, Cerva, Hans and Oppolzer, H. (1991) High-Resolution Imaging of Twin Intersections in Si/Ge Superlattices on Ge(001) Substrates. In: Cullis, Anthony G., (ed.) Microscopy of semiconducting materials 1991. Conference series, 117. Institute of Physics, Bristol, p. 21. ISBN 0-85498-406-2.Date of publication of this fulltext: 08 Feb 2010 13:49
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| Item type | Book section |
| ISBN | 0-85498-406-2 |
| Title of Book: | Microscopy of semiconducting materials 1991 |
|---|---|
| Publisher: | Institute of Physics |
| Place of Publication: | Bristol |
| Other Series: | Conference series |
| Volume: | 117 |
| Page Range: | p. 21 |
| Date | 1991 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Unknown |
| Created at the University of Regensburg | Unknown |
| Item ID | 12764 |
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