New relaxation mechanism in short period strained-layer superlattices
Wegscheider, Werner, Eberl, Karl, Abstreiter, Gerhard, Cerva, Hans and Oppolzer, Helmut (1990) New relaxation mechanism in short period strained-layer superlattices. In: Sinclair, Robert, (ed.) High resolution electron microscopy of defects in materials: symposium held April 16.-18., 1990, San Francisco, California, USA. Materials Research Society symposium proceedings, 183. Materials Research Society, Pittsburgh, Pennsylvania, USA, p. 155. ISBN 1-558-99072-0.Date of publication of this fulltext: 02 Mar 2010 13:34
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| Item type | Book section |
| ISBN | 1-558-99072-0 |
| Title of Book: | High resolution electron microscopy of defects in materials: symposium held April 16.-18., 1990, San Francisco, California, USA |
|---|---|
| Publisher: | Materials Research Society |
| Place of Publication: | Pittsburgh, Pennsylvania, USA |
| Other Series: | Materials Research Society symposium proceedings |
| Volume: | 183 |
| Page Range: | p. 155 |
| Date | 1990 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Unknown |
| Created at the University of Regensburg | Unknown |
| Item ID | 13196 |
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