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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-149156
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.14915
Alternative Links zum Volltext:DOI
Zusammenfassung
Co2MnGe films of different thicknesses (34, 55, and 83 nm) were grown by rf sputtering at 400 degrees C on single-crystal Al2O3 corundum substrates showing an in-plane c axis. Their dynamic magnetic properties were studied using conventional and microstrip line (MS) ferromagnetic resonances (FMRs), as well as Brillouin light scattering (BLS) techniques. The effective ...
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