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Microwave spectroscopy with vector network analyzer for interlayer exchange-coupled symmetrical and asymmetrical NiFe/Ru/NiFe

Belmeguenai, M., Martin, T., Woltersdorf, Georg, Bayreuther, Günther, Baltz, V., Suszka, A. K. and Hickey, B. J. (2008) Microwave spectroscopy with vector network analyzer for interlayer exchange-coupled symmetrical and asymmetrical NiFe/Ru/NiFe. Journal of Physics: Condensed Matter 20 (34), p. 5206.

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Date of publication of this fulltext: 26 May 2010 11:59

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Abstract

Vector network analyzer ferromagnetic resonance spectroscopy (VNA-FMR) is used here to study the different excited modes of sputtered asymmetrical NiFe(13.6 nm)/Ru(d(Ru))/NiFe(27.2 nm) exchange-coupled films with variable Ru thicknesses. The obtained results have been compared to those of the symmetrical NiFe( 30 nm)/Ru( dRu)/NiFe( 30 nm). In both cases, the measurements show the ...

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Item type:Article
Date:August 2008
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Günther Bayreuther
Identification Number:
ValueType
10.1088/0953-8984/20/34/345206DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:14919
Owner only: item control page

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