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Microwave spectroscopy with vector network analyzer for interlayer exchange-coupled symmetrical and asymmetrical NiFe/Ru/NiFe

URN to cite this document:
urn:nbn:de:bvb:355-epub-149199
DOI to cite this document:
10.5283/epub.14919
Belmeguenai, M. ; Martin, T. ; Woltersdorf, Georg ; Bayreuther, Günther ; Baltz, V. ; Suszka, A. K. ; Hickey, B. J.
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Date of publication of this fulltext: 26 May 2010 11:59


Abstract

Vector network analyzer ferromagnetic resonance spectroscopy (VNA-FMR) is used here to study the different excited modes of sputtered asymmetrical NiFe(13.6 nm)/Ru(d(Ru))/NiFe(27.2 nm) exchange-coupled films with variable Ru thicknesses. The obtained results have been compared to those of the symmetrical NiFe( 30 nm)/Ru( dRu)/NiFe( 30 nm). In both cases, the measurements show the ...

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