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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-149199
- DOI to cite this document:
- 10.5283/epub.14919
Alternative links to fulltext:DOI
Abstract
Vector network analyzer ferromagnetic resonance spectroscopy (VNA-FMR) is used here to study the different excited modes of sputtered asymmetrical NiFe(13.6 nm)/Ru(d(Ru))/NiFe(27.2 nm) exchange-coupled films with variable Ru thicknesses. The obtained results have been compared to those of the symmetrical NiFe( 30 nm)/Ru( dRu)/NiFe( 30 nm). In both cases, the measurements show the existence of an ...

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