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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-149412
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.14941
Alternative Links zum Volltext:DOI
Zusammenfassung
The structural and magnetic properties of NiMnSb films, 5-120 nm thick, grown on InGaAs/InP(001) substrates by molecular-beam epitaxy, were studied by x-ray diffraction, transmission electron microscopy (TEM), and ferromagnetic resonance (FMR) techniques. X-ray diffraction and TEM studies show that the NiMnSb films had the expected half-Heusler structure, and films up to 120 nm ...
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