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Heydrich, Stefanie ; Hirmer, Michael ; Preis, C. ; Korn, Tobias ; Eroms, Jonathan ; Weiss, Dieter ; Schüller, Christian

Scanning Raman spectroscopy of graphene antidot lattices: Evidence for systematic p-type doping

Heydrich, Stefanie, Hirmer, Michael, Preis, C., Korn, Tobias, Eroms, Jonathan, Weiss, Dieter und Schüller, Christian (2010) Scanning Raman spectroscopy of graphene antidot lattices: Evidence for systematic p-type doping. Applied Physics Letters 97, 043113.

Veröffentlichungsdatum dieses Volltextes: 11 Aug 2010 10:05
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.16081


Zusammenfassung

We have investigated antidot lattices, which were prepared on exfoliated graphene single layers via electron-beam lithography and ion etching, by means of scanning Raman spectroscopy. The peak positions, peak widths, and intensities of the characteristic phonon modes of the carbon lattice have been studied systematically in a series of samples. In the patterned samples, we found a systematic ...

We have investigated antidot lattices, which were prepared on exfoliated graphene single layers via electron-beam lithography and ion etching, by means of scanning Raman spectroscopy. The peak positions, peak widths, and intensities of the characteristic phonon modes of the carbon lattice have been studied systematically in a series of samples. In the patterned samples, we found a systematic stiffening of the G band phonon mode, accompanied by a line narrowing, while the 2D two-phonon mode energies are found to be linearly correlated with the G mode energies. We interpret this as evidence for p-type doping of the nanostructured graphene.



Beteiligte Einrichtungen


Details

DokumentenartArtikel
Titel eines Journals oder einer ZeitschriftApplied Physics Letters
Verlag:American Institute of Physics
Band:97
Seitenbereich:043113
Datum30 Juli 2010
InstitutionenPhysik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Weiss > Arbeitsgruppe Dieter Weiss
Physik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Lupton > Arbeitsgruppe Christian Schüller
Klassifikation
NotationArt
63.22.Rc, 81.05.ue, 78.30.AmPACS
Stichwörter / Keywordsdoping, electron beam lithography, graphene, phonons, Raman spectra, sputter etching
Dewey-Dezimal-Klassifikation500 Naturwissenschaften und Mathematik > 530 Physik
StatusVeröffentlicht
BegutachtetJa, diese Version wurde begutachtet
An der Universität Regensburg entstandenJa
URN der UB Regensburgurn:nbn:de:bvb:355-epub-160817
Dokumenten-ID16081

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