Chaotic fluctuations and formation of a current filament in n-type GaAs

URN to cite this document:: urn:nbn:de:bvb:355-epub-170646
DOI to cite this document:: 10.5283/epub.17064

Brandl, A. ; Prettl, Wilhelm

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Date of publication of this fulltext: 18 Oct 2010 11:32

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Abstract

A novel nonlinear model is presented for the occurrence of current fluctuations at low temperatures in extrinsic semiconductors. It is based on impact ionization of shallow impurities and structure-forming processes leading to a current filament. Numerical investigations reproduce the current-voltage characteristics and reveal regular, quasiperiodic, and frequency-locked spontaneous current ...