Go to content
UR Home

Effect of substrate-temperature on the microstructure of thin niobium films

Surgers, C., Strunk, Christoph and Löhneysen, H. (1994) Effect of substrate-temperature on the microstructure of thin niobium films. Thin Solid Films 239 (1), pp. 51-56.

[img]
Preview
PDF
Download (542kB)
Date of publication of this fulltext: 22 Dec 2010 07:17

at publisher (via DOI)


Abstract

Niobium films with constant thickness have been deposited on sapphire (11 $($) over bar$$ 20) by electron-beam evaporation at different substrate; temperatures (150 degrees C less than or equal to T-S less than or equal to 750 degrees C). The samples were characterized by X-ray diffraction and resistivity measurements. X-ray reflectivity shows that all films are covered with an oxide layer of ...

plus


Export bibliographical data



Item type:Article
Date:1994
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk
Identification Number:
ValueType
10.1016/0040-6090(94)90107-4DOI
Keywords:X-RAY-DIFFRACTION; NB FILMS; EPITAXIAL-GROWTH; REFLECTION; SURFACES
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:18863
Owner only: item control page

Downloads

Downloads per month over past year

  1. Homepage UR

University Library

Publication Server

Contact:

Publishing: oa@ur.de

Dissertations: dissertationen@ur.de

Research data: daten@ur.de

Contact persons