Scanning Ion Conductance Microscopy with distance-modulated shear force control.
Böcker, M., Anczykowski, B., Wegener, Joachim and Schäffer, T. (2007) Scanning Ion Conductance Microscopy with distance-modulated shear force control. Nanotechnology 18, p. 145505.Date of publication of this fulltext: 24 Mar 2011 07:26
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| Item type | Article |
| Journal or Publication Title | Nanotechnology |
| Publisher: | IOP Publ. (= Institute of Physics) |
|---|---|
| Volume: | 18 |
| Page Range: | p. 145505 |
| Date | 2007 |
| Institutions | Chemistry and Pharmacy > Institut für Analytische Chemie, Chemo- und Biosensorik > Bioanalytik und Biosensorik (Prof. Joachim Wegener) |
| Dewey Decimal Classification | 500 Science > 540 Chemistry & allied sciences |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | No |
| Item ID | 20231 |
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