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Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment

Lechner, Lorenz, Gaaß, Markus, Paila, Antti, Sillanpää, Mika A., Strunk, Christoph and Hakonen, Pertti J. (2011) Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment. Nanotechnology 22 (12), p. 125203.

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Abstract

A scheme for measuring small intrinsic critical currents I c in nanoscale devices is described. Changes in Josephson inductance L J are converted to frequency variations that are recorded via microwave reflection measurements at 700-800 MHz. The critical current is determined from the frequency shift of the reflection magnitude at zero phase bias assuming a sinusoidal current-phase relation. The ...

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Item type:Article
Date:2011
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:21649
Owner only: item control page
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