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Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment

Lechner, Lorenz ; Gaaß, Markus ; Paila, Antti ; Sillanpää, Mika A. ; Strunk, Christoph ; Hakonen, Pertti J.


Abstract

A scheme for measuring small intrinsic critical currents I c in nanoscale devices is described. Changes in Josephson inductance L J are converted to frequency variations that are recorded via microwave reflection measurements at 700-800 MHz. The critical current is determined from the frequency shift of the reflection magnitude at zero phase bias assuming a sinusoidal current-phase relation. The ...

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