Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment
Lechner, Lorenz, Gaaß, Markus, Paila, Antti, Sillanpää, Mika A., Strunk, Christoph and Hakonen, Pertti J. (2011) Microwave reflection measurement of critical currents in a nanotube Josephson transistor with a resistive environment. Nanotechnology 22 (12), p. 125203.Date of publication of this fulltext: 08 Aug 2011 10:53
Article
Involved Institutions
Details
| Item type | Article |
| Journal or Publication Title | Nanotechnology |
| Publisher: | Institute of Physics |
|---|---|
| Volume: | 22 |
| Number of Issue or Book Chapter: | 12 |
| Page Range: | p. 125203 |
| Date | 2011 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 21649 |
Export bibliographical data
Owner only: item control page
More literature (via CORE)
More literature (via CORE)