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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-22070
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.2207
Zusammenfassung
The enhancement of the emission rate of charge carriers from deep-level defects in electric field is routinely used to determine the charge state of the defects. However, only a limited number of defects can be satisfactorily described by the Poole-Frenkel theory. An electric field dependence different from that expected from the Poole-Frenkel theory has been repeatedly reported in the ...
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