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Ganichev, Sergey

Review: Tunnel ionization of deep impurities in semiconductors induced by terahertz electric fields

Ganichev, Sergey (1999) Review: Tunnel ionization of deep impurities in semiconductors induced by terahertz electric fields. Physica B 273-27, pp. 737-742.

Date of publication of this fulltext: 05 Aug 2009 13:37
Article
DOI to cite this document: 10.5283/epub.2213


Abstract

An analysis is made of the ionization of deep impurity centers induced by high-intensity terahertz radiation whose photon energies are tens of times lower than the impurity ionization energy. Under these conditions, ionization can be described as phonon-assisted tunneling in which carrier emission is accompanied by defect tunneling in configuration space and electron tunneling in the electric ...

An analysis is made of the ionization of deep impurity centers induced by high-intensity terahertz radiation whose photon energies are tens of times lower than the impurity ionization energy. Under these conditions, ionization can be described as phonon-assisted tunneling in which carrier emission is accompanied by defect tunneling in configuration space and electron tunneling in the electric field of the radiation. At high intensities the ionization is caused by direct tunneling. Within a broad range of intensity, frequency and temperature, the terahertz electric field of the radiation acts like a static field. For very high frequencies and low temperatures an enhancement in tunneling as compared to static fields takes place.



Involved Institutions


Details

Item typeArticle
Journal or Publication TitlePhysica B
Volume:273-27
Page Range:pp. 737-742
Date15 December 1999
InstitutionsPhysics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev
Identification Number
ValueType
10.1016/S0921-4526(99)00637-7DOI
KeywordsTunnel ionization; Terahertz; Far-infrared; Deep centers
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
URN of the UB Regensburgurn:nbn:de:bvb:355-epub-22134
Item ID2213

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