Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-253162
DOI to cite this document:: 10.5283/epub.25316

Giessibl, Franz J. ; Hembacher, Stefan ; Bielefeldt, Hartmut ; Mannhart, Jochen

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Date of publication of this fulltext: 10 Jul 2012 13:57

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Abstract

The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7×7), two ...