Exploring the Nanoworld with Atomic Force Microscopy
Article
Giessibl, Franz J.
and Quate, Calvin F.
(2006)
Exploring the Nanoworld with Atomic Force Microscopy.
Physics today 59 (12), pp. 44-50.
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| Item type | Article | ||||||||
| Journal or Publication Title | Physics today | ||||||||
| Publisher | AMER INST PHYSICS | ||||||||
| Place of Publication | MELVILLE | ||||||||
| Volume | 59 | ||||||||
| Number of Issue or Book Chapter | 12 | ||||||||
| Page Range | pp. 44-50 | ||||||||
| Date | December 2006 | ||||||||
| Date of publication | 10 Jul 2012 14:00 | ||||||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||||||
| Identification Number |
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| Classification |
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| Keywords | SILICON (111)-(7X7) SURFACE; RESOLUTION; DEFECTS; | ||||||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||||||
| Status | Published | ||||||||
| Refereed | Yes, this version has been refereed | ||||||||
| Created at the University of Regensburg | Partially | ||||||||
| Item ID | 25317 |
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