Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), pp. 44-50.
Full text not available from this repository.
Abstract
Over its 20‐year history, the atomic force microscope has gradually evolved into an instrument whose spatial resolution is now fine enough to image subatomic features on the scale of picometers.
Export bibliographical data
| Item type: | Article | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| Date: | December 2006 | ||||||||
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||||||
| Identification Number: |
| ||||||||
| Classification: |
| ||||||||
| Dewey Decimal Classification: | 500 Science > 530 Physics | ||||||||
| Status: | Published | ||||||||
| Refereed: | Yes, this version has been refereed | ||||||||
| Created at the University of Regensburg: | Partially | ||||||||
| Item ID: | 25317 |
Owner only: item control page
Altmetric
Altmetric