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Simultaneous current-, force-, and work-function measurement with atomic resolution

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Herz, Markus ; Schiller, Christian H. ; Giessibl, Franz J. ; Mannhart, Jochen
Date of publication of this fulltext: 10 Jul 2012 14:12


The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work-function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the ...


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