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Simultaneous current-, force-, and work-function measurement with atomic resolution

URN to cite this document:
urn:nbn:de:bvb:355-epub-253246
Herz, Markus ; Schiller, Christian H. ; Giessibl, Franz J. ; Mannhart, Jochen
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Date of publication of this fulltext: 10 Jul 2012 14:12


Abstract

The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work-function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the ...

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