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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253269
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25326
Zusammenfassung
Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed.
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