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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253280
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25328
Zusammenfassung
Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacuum with atomic resolution possible. Here, we demonstrate a new approach which simplifies the implementation of FM-AFM considerably and enhances force sensitivity by directly exciting the cantilever with the thermal effects involved in the deflection measurement process. This approach reduces the ...
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