Self-oscillating mode for frequency modulation noncontact atomic force microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-253280
DOI to cite this document:: 10.5283/epub.25328

Giessibl, Franz J. ; Tortonese, Marco

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Date of publication of this fulltext: 10 Jul 2012 14:21

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Abstract

Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacuum with atomic resolution possible. Here, we demonstrate a new approach which simplifies the implementation of FM-AFM considerably and enhances force sensitivity by directly exciting the cantilever with the thermal effects involved in the deflection measurement process. This approach reduces the ...