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Self-oscillating mode for frequency modulation noncontact atomic force microscopy

Giessibl, Franz J. and Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters 70 (19), pp. 2529-2531.

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Frequency modulation atomic force microscopy (FM-AFM) has made imaging of surfaces in ultrahigh vacuum with atomic resolution possible. Here, we demonstrate a new approach which simplifies the implementation of FM-AFM considerably and enhances force sensitivity by directly exciting the cantilever with the thermal effects involved in the deflection measurement process. This approach reduces the ...


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Item type:Article
Date:12 May 1997
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
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Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:25328
Owner only: item control page


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