Facet degradation of (Al,In)GaN laser diodes
Schoedl, T., Schwarz, Uli, Miller, S., Leber, A., Furitsch, M., Lell, A. and Härle, V. (2004) Facet degradation of (Al,In)GaN laser diodes. phys. stat. sol. (a) 201, p. 2635.Date of publication of this fulltext: 05 Aug 2009 13:40
Article
Involved Institutions
Details
| Item type | Article |
| Journal or Publication Title | phys. stat. sol. (a) |
| Volume: | 201 |
|---|---|
| Page Range: | p. 2635 |
| Date | 2004 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Ulrich Schwarz |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 2602 |
Export bibliographical data
Owner only: item control page
More literature (via CORE)
More literature (via CORE)