Degradation Analysis of InGaN Laser Diodes
Article
Kümmler, V., Brüderl, G., Bader, S., Miller, S., Weimar, A., Lell, A., Härle, V., Schwarz, Uli, Gmeinwieser, N. and Wegscheider, Werner (2002) Degradation Analysis of InGaN Laser Diodes. phys. stat. sol. (a) 194, p. 419.Involved Institutions
Details
| Item type | Article |
| Journal or Publication Title | phys. stat. sol. (a) |
| Volume | 194 |
| Page Range | p. 419 |
| Date | 2002 |
| Date of publication | 05 Aug 2009 13:40 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Ulrich Schwarz |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 2610 |
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