Strain and dislocation reduction in maskless pendeo-epitaxy GaN thin films
Article
Roskowsky, A., Miraglia, P., Preble, E., Einfeldt, S., Stiles, T., Davis, R., Schuck, J., Grober, R. and Schwarz, Uli (2001) Strain and dislocation reduction in maskless pendeo-epitaxy GaN thin films. phys. stat. sol. (a) 188, p. 729.Involved Institutions
Details
| Item type | Article |
| Journal or Publication Title | phys. stat. sol. (a) |
| Volume | 188 |
| Page Range | p. 729 |
| Date | 2001 |
| Date of publication | 05 Aug 2009 13:40 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Ulrich Schwarz |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 2613 |
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