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Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes

Plechinger, Gerd , Heydrich, Stefanie, Eroms, Jonathan , Weiss, Dieter , Schüller, Christian and Korn, Tobias (2012) Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes. Applied Physics Letters 101, p. 101906.

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Date of publication of this fulltext: 23 Oct 2012 06:37

Abstract

Single- and few-layer MoS2 has recently gained attention as an interesting material system for opto-electronics. Here, we report on scanning Raman measurements on few-layer MoS2 flakes prepared by exfoliation. We observe a Raman mode corresponding to a rigid shearing oscillation of adjacent layers. This mode appears at very low Raman shifts between 20 and 30 cm−1. Its position strongly depends on ...

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Item type:Article
Date:5 September 2012
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller
Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Projects:SFB 689: Spinphänomene in reduzierten Dimensionen, GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1063/1.4751266UNSPECIFIED
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:26458
Owner only: item control page

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