Go to content
UR Home

Optimizing atomic resolution of force microscopy in ambient conditions

URN to cite this document:
Wastl, Daniel S. ; Weymouth, Alfred J. ; Giessibl, Franz J.
Date of publication of this fulltext: 21 Jun 2013 06:07


Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy ...


Owner only: item control page
  1. Homepage UR

University Library

Publication Server


Publishing: oa@ur.de

Dissertations: dissertationen@ur.de

Research data: daten@ur.de

Contact persons