Optimizing atomic resolution of force microscopy in ambient conditions

URN to cite this document:: urn:nbn:de:bvb:355-epub-283932
DOI to cite this document:: 10.5283/epub.28393

Wastl, Daniel S. ; Weymouth, Alfred J. ; Giessibl, Franz J.

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Date of publication of this fulltext: 21 Jun 2013 06:07

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Abstract

Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy ...