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Optimizing atomic resolution of force microscopy in ambient conditions

Wastl, Daniel S., Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), 245415-1-245415-10.

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Date of publication of this fulltext: 21 Jun 2013 06:07

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Other URL: http://prb.aps.org/abstract/PRB/v87/i24/e245415, http://arxiv.org/pdf/1303.5204.pdf


Abstract

Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy ...

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Item type:Article
Date:12 June 2013
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:SFB 689: Spinphänomene in reduzierten Dimensionen, GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1103/PhysRevB.87.245415DOI
1303.5204v2arXiv ID
Classification:
NotationType
07.79.LhPACS
34.20.-bPACS
68.08.-pPACS
68.37.PsPACS
Keywords:atomic force microscopy, ambient conditions, tunigfork, AFM, air, atomic resolution, damping, dissipation,
Dewey Decimal Classification:500 Science > 500 Natural sciences & mathematics
500 Science > 530 Physics
500 Science > 540 Chemistry & allied sciences
500 Science > 570 Life sciences
600 Technology > 600 Technology (Applied sciences)
600 Technology > 610 Medical sciences Medicine
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:28393
Owner only: item control page

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