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Image correction for atomic force microscopy images with functionalized tips

URN to cite this document:
urn:nbn:de:bvb:355-epub-299109
Neu, Mathias ; Moll, Nikolaj ; Gross, Leo ; Meyer, Gerhard ; Giessibl, Franz J. ; Repp, Jascha
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Date of publication of this fulltext: 08 May 2014 08:23


Abstract

It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.


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