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Image correction for atomic force microscopy images with functionalized tips

Neu, Mathias, Moll, Nikolaj, Gross, Leo, Meyer, Gerhard, Giessibl, Franz J. and Repp, Jascha (2014) Image correction for atomic force microscopy images with functionalized tips. Physical Review B 89 (20), p. 205407.

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Date of publication of this fulltext: 08 May 2014 08:23

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Other URL: http://link.aps.org/doi/10.1103/PhysRevB.89.205407


It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.

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Item type:Article
Date:7 May 2014
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp
Projects:SPP 1243: Quantum transport at the molecular scale
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Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Partially
Item ID:29910
Owner only: item control page


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