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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-310727
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.31072
Zusammenfassung
A systematic theory of the conductance measurements of noninvasive (weak probe) scanning gate microscopy is presented that provides an interpretation of what precisely is being measured. A scattering approach is used to derive explicit expressions for the first- and second-order conductance changes due to the perturbation by the tip potential in terms of the scattering states of the unperturbed ...
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