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Two-dimensional topological insulator edge state backscattering by dephasing

URN to cite this document:
urn:nbn:de:bvb:355-epub-325845
DOI to cite this document:
10.5283/epub.32584
Essert, Sven ; Krueckl, Viktor ; Richter, Klaus
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arXiv PDF (03.07.2015)
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Date of publication of this fulltext: 15 Oct 2015 09:39



Abstract

To understand the seemingly absent temperature dependence in the conductance of two-dimensional topological insulator edge states, we perform a numerical study which identifies the quantitative influence of the combined effect of dephasing and elastic scattering in charge puddles close to the edges. We show that this mechanism may be responsible for the experimental signatures in HgTe/CdTe ...

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