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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-341566
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.34156
Alternative Links zum Volltext:DOI
Zusammenfassung
It is well known that scanning probe techniques such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) routinely offer atomic scale information on the geometric and the electronic structure of solids. Recent developments in STM and especially in non-contact AFM have allowed imaging and spectroscopy of individual molecules on surfaces with unprecedented spatial resolution, ...
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