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Combined STM/AFM with functionalized tips applied to individual molecules: Chemical reactions, geometric structure and charge distribution

URN to cite this document:
urn:nbn:de:bvb:355-epub-344812
Albrecht, Florian
Date of publication of this fulltext: 02 Jan 2017 09:18


Abstract (English)

Scanning probe microscopy (SPM) methods allow for investigations of the atomistic world in real space. While scanning tunneling microscopy (STM) is sensitive to the electronic structure of the sample, its geometry can be explored by means of atomic force microscopy (AFM). Suitable functionalization of the AFM tip enables resolving the chemical structure of individual molecules at low temperatures ...

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Translation of the abstract (German)

Rastersondenmikroskopie (SPM) macht die Untersuchung der atomaren Welt im Realraum möglich. Während man mit Rastertunnel-Mikroskopie (STM) die elektronische Struktur einer Probe untersucht, können ihre geometrischen Eigenschaften mittels Rasterkraft-Mikroskopie (AFM) erforscht werden. Unter ultrahoch-vakuum Bedingungen bei tiefen Temperaturen erlaubt die Funktionalisierung der AFM-Spitze mit ...

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