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Mittendorff, Martin ; Kamann, Josef ; Eroms, Jonathan ; Weiss, Dieter ; Drexler, Christoph ; Ganichev, Sergey ; Kerbusch, Jochen ; Erbe, Artur ; Suess, Ryan J. ; Murphy, Thomas E. ; Chatterjee, Sangam ; Kolata, Kolja ; Ohser, Joachim ; Koenig-Otto, Jacob ; Schneider, Harald ; Helm, Manfred ; Winnerl, Stephan

Universal ultrafast detector for short optical pulses based on graphene

Article

Mittendorff, Martin , Kamann, Josef, Eroms, Jonathan , Weiss, Dieter, Drexler, Christoph, Ganichev, Sergey, Kerbusch, Jochen, Erbe, Artur , Suess, Ryan J., Murphy, Thomas E. , Chatterjee, Sangam , Kolata, Kolja, Ohser, Joachim, Koenig-Otto, Jacob, Schneider, Harald , Helm, Manfred and Winnerl, Stephan (2015) Universal ultrafast detector for short optical pulses based on graphene. Opt. Express 23 (22), pp. 28728-28735.

DOI to cite this document: 10.5283/epub.34921


Abstract

Graphene has unique optical and electronic properties that make it attractive as an active material for broadband ultrafast detection. We present here a graphene-based detector that shows 40-picosecond electrical rise time over a spectral range that spans nearly three orders of magnitude, from the visible to the far-infrared. The detector employs a large area graphene active region with ...

Graphene has unique optical and electronic properties that make it attractive as an active material for broadband ultrafast detection. We present here a graphene-based detector that shows 40-picosecond electrical rise time over a spectral range that spans nearly three orders of magnitude, from the visible to the far-infrared. The detector employs a large area graphene active region with interdigitated electrodes that are connected to a log-periodic antenna to improve the long-wavelength collection efficiency, and a silicon carbide substrate that is transparent throughout the visible regime. The detector exhibits a noise-equivalent power of approximately 100 mu W.Hz(-1/2) and is characterized at wavelengths from 780 nm to 500 mu m. (C) 2015 Optical Society of America



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Details

Item typeArticle
Journal or Publication TitleOpt. Express
PublisherOPTICAL SOC AMER
Place of PublicationWASHINGTON
Volume23
Number of Issue or Book Chapter22
Page Rangepp. 28728-28735
DateNovember 2015
Date of publication02 Dec 2016 12:15
InstitutionsPhysics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev
Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Identification Number
ValueType
10.1364/OE.23.028728DOI
KeywordsDEEP IMPURITIES; TERAHERTZ; PHOTODETECTORS; SEMICONDUCTORS; TRANSISTORS; IONIZATION; RADIATION; LASER;
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
URN of the UB Regensburgurn:nbn:de:bvb:355-epub-349218
Item ID34921

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