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On the achievable field sensitivity of a segmented annular detector for differential phase contrast measurements

Schwarzhuber, Felix, Melzl, Peter and Zweck, Josef (2017) On the achievable field sensitivity of a segmented annular detector for differential phase contrast measurements. Ultramicroscopy 177, pp. 97-105.

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Other URL: http://doi.org/10.1016/j.ultramic.2017.02.005


Abstract

Differential phase contrast microscopy measures minute deflections of the electron probe due to electric and/or magnetic fields, using a position sensitive device. Although recently, pixelated detectors have become available which.also serve as a position sensitive device, the most frequently used detector is a four-segmented annular semiconducting detector ring (or variations thereof), where the ...

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Item type:Article
Date:2017
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Josef Zweck
Identification Number:
ValueType
10.1016/j.ultramic.2017.02.005DOI
Keywords:TRANSMISSION ELECTRON-MICROSCOPY; MAGNETIC-STRUCTURES; ATOMIC-RESOLUTION; DOMAIN-STRUCTURES; THIN FOILS; STEM;
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:38975
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