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On the achievable field sensitivity of a segmented annular detector for differential phase contrast measurements

Schwarzhuber, Felix ; Melzl, Peter ; Zweck, Josef



Abstract

Differential phase contrast microscopy measures minute deflections of the electron probe due to electric and/or magnetic fields, using a position sensitive device. Although recently, pixelated detectors have become available which.also serve as a position sensitive device, the most frequently used detector is a four-segmented annular semiconducting detector ring (or variations thereof), where the ...

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