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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-437544
- DOI to cite this document:
- 10.5283/epub.43754
Abstract
Electronic transport properties of single-molecule junctions have been widely measured by several techniques, including mechanically controllable break junctions, electromigration break junctions, and by means of scanning tunneling microscopes. In parallel, many theoretical tools have been developed and refined for describing such transport properties and for obtaining numerical predictions. Most ...
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