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The electronic thickness of graphene

Rickhaus, Peter ; Liu, Ming-Hao ; Kurpas, Marcin ; Kurzmann, Annika ; Lee, Yongjin ; Overweg, Hiske ; Eich, Marius ; Pisoni, Riccardo ; Taniguchi, Takashi ; Watanabe, Kenji ; Richter, Klaus ; Ensslin, Klaus ; Ihn, Thomas



Abstract

When two dimensional crystals are atomically close, their finite thickness becomes relevant. Using transport measurements, we investigate the electrostatics of two graphene layers, twisted by theta = 22 degrees such that the layers are decoupled by the huge momentum mismatch between the K and K' points of the two layers. We observe a splitting of the zero-density lines of the two layers with ...

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