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Rickhaus, Peter ; Liu, Ming-Hao ; Kurpas, Marcin ; Kurzmann, Annika ; Lee, Yongjin ; Overweg, Hiske ; Eich, Marius ; Pisoni, Riccardo ; Taniguchi, Takashi ; Watanabe, Kenji ; Richter, Klaus ; Ensslin, Klaus ; Ihn, Thomas

The electronic thickness of graphene

Rickhaus, Peter , Liu, Ming-Hao , Kurpas, Marcin , Kurzmann, Annika , Lee, Yongjin, Overweg, Hiske, Eich, Marius, Pisoni, Riccardo, Taniguchi, Takashi, Watanabe, Kenji, Richter, Klaus, Ensslin, Klaus and Ihn, Thomas (2020) The electronic thickness of graphene. Science Advances 6 (11), eaay8409.

Date of publication of this fulltext: 11 Oct 2021 13:01
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Item typeArticle
Journal or Publication TitleScience Advances
Publisher:AMER ASSOC ADVANCEMENT SCIENCE
Place of Publication:WASHINGTON
Volume:6
Number of Issue or Book Chapter:11
Page Range:eaay8409
Date2020
InstitutionsPhysics > Institute of Theroretical Physics > Chair Professor Richter > Group Klaus Richter
Identification Number
ValueType
10.1126/sciadv.aay8409DOI
KeywordsHETEROSTRUCTURES; INTERFERENCE; STATES; DRAG;
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
Item ID50254

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