Go to content
UR Home

Extracting the shape of nanometric field emitters

Beinke, Daniel ; Bürger, Felicitas ; Solodenko, Helena ; Acharya, Rachana ; Klauk, Hagen ; Schmitz, Guido


The high resolution nanoanalysis by atom probe tomography is based on needle-shaped samples that represent nanometric field emitters with typical curvature radii of 50 nm. After field desorption and detection of a large set of atoms, the sample volume has to be numerically reconstructed. Conventionally, this reconstruction is performed with the assumption of a hemispherical apex. This established ...


Owner only: item control page
  1. Homepage UR

University Library

Publication Server


Publishing: oa@ur.de
0941 943 4239

Dissertations: dissertationen@ur.de
0941 943 3904

Research data: daten@ur.de
0941 943 4239

Contact persons