Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes

URN to cite this document:: urn:nbn:de:bvb:355-epub-509720
DOI to cite this document:: 10.5283/epub.50972

Kirpal, Dominik ; Qiu, Jinglan

; Pürckhauer, Korbinian ; Weymouth, Alfred J.

; Metz, Michael ; Giessibl, Franz J.

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Date of publication of this fulltext: 05 Nov 2021 09:27

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Abstract

Frequency-modulation atomic force microscopy (AFM) with a qPlus sensor allows one to atomically resolve surfaces in a variety of environments ranging from low-temperature in ultra-high vacuum to ambient and liquid conditions. Typically, the tip is driven to oscillate vertically, giving a measure of the vertical force component. However, for many systems, the lateral force component provides ...