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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-509720
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.50972
Zusammenfassung
Frequency-modulation atomic force microscopy (AFM) with a qPlus sensor allows one to atomically resolve surfaces in a variety of environments ranging from low-temperature in ultra-high vacuum to ambient and liquid conditions. Typically, the tip is driven to oscillate vertically, giving a measure of the vertical force component. However, for many systems, the lateral force component provides ...
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