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Quantitative Atomic Force Microscopy with Carbon Monoxide Terminated Tips

Sun, Zhixiang ; Boneschanscher, Mark P. ; Swart, Ingmar ; Vanmaekelbergh, Daniël ; Liljeroth, Peter



Abstract

Noncontact atomic force microscopy (AFM) has recently progressed tremendously in achieving atomic resolution imaging through the use of small oscillation amplitudes and well-defined modification of the tip apex. In particular, it has been shown that picking up simple inorganic molecules (such as CO) by the AFM tip leads to a well-defined tip apex and to enhanced image resolution. Here, we use the ...

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