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Influence of ridge geometry on lateral mode stability of (Al,In)GaN laser diodes

Schwarz, Ulrich T. ; Pindl, Markus ; Sturm, Evi ; Furitsch, Michael ; Leber, Andreas ; Miller, Stephan ; Lell, Alfred ; Härle, Volker



Abstract

Height and width of the ridge forming the laser diode waveguide determine threshold current density and lateral mode stability. We measure the optical near-field of the laser mode and simulate the two-dimensional mode distribution including waveguide losses and optical gain. The simulations show that weak guiding and not current spreading is the major cause for increased threshold current ...

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