The local defect index up to finite ambiguity
Article
Bechtluft-Sachs, Stefan and Hien, Marco (2002) The local defect index up to finite ambiguity. Topology and its Applications 119 (2), pp. 113-116.Alternative links to fulltext
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Details
| Item type | Article | ||||
| Journal or Publication Title | Topology and its Applications | ||||
| Publisher | ELSEVIER SCIENCE BV | ||||
| Place of Publication | AMSTERDAM | ||||
| Volume | 119 | ||||
| Number of Issue or Book Chapter | 2 | ||||
| Page Range | pp. 113-116 | ||||
| Date | 2002 | ||||
| Date of publication | 19 Dec 2024 15:43 | ||||
| Institutions | Mathematics | ||||
| Identification Number |
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| Keywords | ; Hopf invariant; defect index | ||||
| Dewey Decimal Classification | 500 Science > 510 Mathematics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 73039 |
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