The local defect index up to finite ambiguity
Bechtluft-Sachs, Stefan and Hien, Marco (2002) The local defect index up to finite ambiguity. Topology and its Applications 119 (2), pp. 113-116.Date of publication of this fulltext: 19 Dec 2024 15:43
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| Item type | Article | ||||
| Journal or Publication Title | Topology and its Applications | ||||
| Publisher: | ELSEVIER SCIENCE BV | ||||
|---|---|---|---|---|---|
| Place of Publication: | AMSTERDAM | ||||
| Volume: | 119 | ||||
| Number of Issue or Book Chapter: | 2 | ||||
| Page Range: | pp. 113-116 | ||||
| Date | 2002 | ||||
| Institutions | Mathematics | ||||
| Identification Number |
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| Keywords | ; Hopf invariant; defect index | ||||
| Dewey Decimal Classification | 500 Science > 510 Mathematics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| Item ID | 73039 |
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