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Derivation of pair distribution functions for interface interdiffusion analysis for multilayered thin films using high-energy electron diffraction

Brunner, W ; Attenberger, W ; Hoffmann, H ; Zweck, J



Zusammenfassung

High-energy electron diffraction has been used to obtain reduced density functions from multilayered thin films. Due to the very nature of the experiment, only interatomic correlations perpendicular to the incoming electron beam are responsible for the scattered intensity. This allows an investigation of the interface interdiffusion of inner surfaces. Since no specimen preparation is needed, the ...

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