Startseite UR

Phonon Dispersion Curves in Wurtzite-Structure GaN Determined by Inelastic X-Ray Scattering

Ruf, T. ; Serrano, J. ; Cardona, M. ; Pavone, P. ; Pabst, M. ; Krisch, M. ; D'Astuto, M. ; Suski, T. ; Grzegory, I. ; Leszczynski, M.



Zusammenfassung

We have investigated the lattice dynamics of a wurtzite GaN single crystal by inelastic x-ray scattering. Several dispersion branches and phonons at high-symmetry points have been measured, including the two zone-center Raman- and infrared-inactive silent modes. The experiments have been complemented by ab initio calculations. They are in very good agreement with our measurements, not only for ...

plus


Nur für Besitzer und Autoren: Kontrollseite des Eintrags
  1. Universität

Universitätsbibliothek

Publikationsserver

Kontakt:

Publizieren: oa@ur.de
0941 943 -4239 oder -69394

Dissertationen: dissertationen@ur.de
0941 943 -3904

Forschungsdaten: datahub@ur.de
0941 943 -5707

Ansprechpartner