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Volk, Christian ; Chatterjee, Anasua ; Ansaloni, Fabio ; Marcus, Charles M. ; Kuemmeth, Ferdinand

Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate

Artikel

Volk, Christian, Chatterjee, Anasua, Ansaloni, Fabio, Marcus, Charles M. und Kuemmeth, Ferdinand (2019) Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate. Nano Letters 19 (8), S. 5628-5633.

DOI zum Zitieren dieses Dokuments: 10.5283/epub.79166


Zusammenfassung

Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout ...

Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout methods are limited to measuring qubit capacitance, rather than qubit charge. By coupling a surface-mount resonant circuit to the plunger gate of a high-impedance sensor, we realized a fast charge sensing technique that is compatible with resistive 2DEGs. We demonstrate this by acquiring at high speed charge stability diagrams of double- and triple-dot arrays in Si/SiGe heterostructures as well as pulsed-gate single-shot charge and spin readout with integration times as low as 2.4 μs.



Beteiligte Einrichtungen


Details

DokumentenartArtikel
Titel eines Journals oder einer ZeitschriftNano Letters
VerlagAmerican Chemical Society (ACS)
Band19
Nummer des Zeitschriftenheftes oder des Kapitels8
SeitenbereichS. 5628-5633
Datum24 Juli 2019
Veröffentlichungsdatum09 Apr 2026 07:27
InstitutionenPhysik > Institut für Experimentelle und Angewandte Physik
Identifikationsnummer
WertTyp
10.1021/acs.nanolett.9b02149DOI
1906.10584arXiv-ID
Stichwörter / KeywordsCharge sensing, quantum dots, spin qubits, reflectometry, silicon, Si/SiGe
Dewey-Dezimal-Klassifikation500 Naturwissenschaften und Mathematik > 530 Physik
StatusVeröffentlicht
BegutachtetNein, diese Version wurde noch nicht begutachtet (bei preprints)
An der Universität Regensburg entstandenNein
URN der UB Regensburgurn:nbn:de:bvb:355-epub-791662
Dokumenten-ID79166

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