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Volk, Christian ; Chatterjee, Anasua ; Ansaloni, Fabio ; Marcus, Charles M. ; Kuemmeth, Ferdinand

Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate

Volk, Christian, Chatterjee, Anasua, Ansaloni, Fabio, Marcus, Charles M. and Kuemmeth, Ferdinand (2019) Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate. Nano Letters 19 (8), pp. 5628-5633.

Date of publication of this fulltext: 09 Apr 2026 07:27
Article
DOI to cite this document: 10.5283/epub.79166


Abstract

Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout ...

Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout methods are limited to measuring qubit capacitance, rather than qubit charge. By coupling a surface-mount resonant circuit to the plunger gate of a high-impedance sensor, we realized a fast charge sensing technique that is compatible with resistive 2DEGs. We demonstrate this by acquiring at high speed charge stability diagrams of double- and triple-dot arrays in Si/SiGe heterostructures as well as pulsed-gate single-shot charge and spin readout with integration times as low as 2.4 μs.



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Details

Item typeArticle
Journal or Publication TitleNano Letters
Publisher:American Chemical Society (ACS)
Volume:19
Number of Issue or Book Chapter:8
Page Range:pp. 5628-5633
Date24 July 2019
InstitutionsPhysics > Institute of Experimental and Applied Physics
Identification Number
ValueType
10.1021/acs.nanolett.9b02149DOI
1906.10584arXiv ID
KeywordsCharge sensing, quantum dots, spin qubits, reflectometry, silicon, Si/SiGe
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedNo, this version has not been refereed yet (as with preprints)
Created at the University of RegensburgNo
URN of the UB Regensburgurn:nbn:de:bvb:355-epub-791662
Item ID79166

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