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Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate
Volk, Christian, Chatterjee, Anasua, Ansaloni, Fabio, Marcus, Charles M. und Kuemmeth, Ferdinand
(2019)
Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate.
Nano Letters 19 (8), S. 5628-5633.
Veröffentlichungsdatum dieses Volltextes: 09 Apr 2026 07:27
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.79166
Zusammenfassung
Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout ...
Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout methods are limited to measuring qubit capacitance, rather than qubit charge. By coupling a surface-mount resonant circuit to the plunger gate of a high-impedance sensor, we realized a fast charge sensing technique that is compatible with resistive 2DEGs. We demonstrate this by acquiring at high speed charge stability diagrams of double- and triple-dot arrays in Si/SiGe heterostructures as well as pulsed-gate single-shot charge and spin readout with integration times as low as 2.4 μs.
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| Dokumentenart | Artikel | ||||||
| Titel eines Journals oder einer Zeitschrift | Nano Letters | ||||||
| Verlag: | American Chemical Society (ACS) | ||||||
|---|---|---|---|---|---|---|---|
| Band: | 19 | ||||||
| Nummer des Zeitschriftenheftes oder des Kapitels: | 8 | ||||||
| Seitenbereich: | S. 5628-5633 | ||||||
| Datum | 24 Juli 2019 | ||||||
| Institutionen | Physik > Institut für Experimentelle und Angewandte Physik | ||||||
| Identifikationsnummer |
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| Stichwörter / Keywords | Charge sensing, quantum dots, spin qubits, reflectometry, silicon, Si/SiGe | ||||||
| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||||
| Status | Veröffentlicht | ||||||
| Begutachtet | Nein, diese Version wurde noch nicht begutachtet (bei preprints) | ||||||
| An der Universität Regensburg entstanden | Nein | ||||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-791662 | ||||||
| Dokumenten-ID | 79166 |
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