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Volk, Christian ; Chatterjee, Anasua ; Ansaloni, Fabio ; Marcus, Charles M. ; Kuemmeth, Ferdinand

Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate

Volk, Christian, Chatterjee, Anasua, Ansaloni, Fabio, Marcus, Charles M. und Kuemmeth, Ferdinand (2019) Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate. Nano Letters 19 (8), S. 5628-5633.

Veröffentlichungsdatum dieses Volltextes: 09 Apr 2026 07:27
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.79166


Zusammenfassung

Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout ...

Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout methods are limited to measuring qubit capacitance, rather than qubit charge. By coupling a surface-mount resonant circuit to the plunger gate of a high-impedance sensor, we realized a fast charge sensing technique that is compatible with resistive 2DEGs. We demonstrate this by acquiring at high speed charge stability diagrams of double- and triple-dot arrays in Si/SiGe heterostructures as well as pulsed-gate single-shot charge and spin readout with integration times as low as 2.4 μs.



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Details

DokumentenartArtikel
Titel eines Journals oder einer ZeitschriftNano Letters
Verlag:American Chemical Society (ACS)
Band:19
Nummer des Zeitschriftenheftes oder des Kapitels:8
Seitenbereich:S. 5628-5633
Datum24 Juli 2019
InstitutionenPhysik > Institut für Experimentelle und Angewandte Physik
Identifikationsnummer
WertTyp
10.1021/acs.nanolett.9b02149DOI
1906.10584arXiv-ID
Stichwörter / KeywordsCharge sensing, quantum dots, spin qubits, reflectometry, silicon, Si/SiGe
Dewey-Dezimal-Klassifikation500 Naturwissenschaften und Mathematik > 530 Physik
StatusVeröffentlicht
BegutachtetNein, diese Version wurde noch nicht begutachtet (bei preprints)
An der Universität Regensburg entstandenNein
URN der UB Regensburgurn:nbn:de:bvb:355-epub-791662
Dokumenten-ID79166

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