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Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate
Volk, Christian, Chatterjee, Anasua, Ansaloni, Fabio, Marcus, Charles M. and Kuemmeth, Ferdinand
(2019)
Fast Charge Sensing of Si/SiGe Quantum Dots via a High-Frequency Accumulation Gate.
Nano Letters 19 (8), pp. 5628-5633.
Date of publication of this fulltext: 09 Apr 2026 07:27
Article
DOI to cite this document: 10.5283/epub.79166
Abstract
Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout ...
Quantum dot arrays are a versatile platform for the implementation of spin qubits, as high-bandwidth sensor dots can be integrated with single-, double-, and triple-dot qubits yielding fast and high-fidelity qubit readout. However, for undoped silicon devices, reflectometry off sensor ohmics suffers from the finite resistivity of the two-dimensional electron gas (2DEG), and alternative readout methods are limited to measuring qubit capacitance, rather than qubit charge. By coupling a surface-mount resonant circuit to the plunger gate of a high-impedance sensor, we realized a fast charge sensing technique that is compatible with resistive 2DEGs. We demonstrate this by acquiring at high speed charge stability diagrams of double- and triple-dot arrays in Si/SiGe heterostructures as well as pulsed-gate single-shot charge and spin readout with integration times as low as 2.4 μs.
Involved Institutions
Details
| Item type | Article | ||||||
| Journal or Publication Title | Nano Letters | ||||||
| Publisher: | American Chemical Society (ACS) | ||||||
|---|---|---|---|---|---|---|---|
| Volume: | 19 | ||||||
| Number of Issue or Book Chapter: | 8 | ||||||
| Page Range: | pp. 5628-5633 | ||||||
| Date | 24 July 2019 | ||||||
| Institutions | Physics > Institute of Experimental and Applied Physics | ||||||
| Identification Number |
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| Keywords | Charge sensing, quantum dots, spin qubits, reflectometry, silicon, Si/SiGe | ||||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||||
| Status | Published | ||||||
| Refereed | No, this version has not been refereed yet (as with preprints) | ||||||
| Created at the University of Regensburg | No | ||||||
| URN of the UB Regensburg | urn:nbn:de:bvb:355-epub-791662 | ||||||
| Item ID | 79166 |
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