Microstrip line ferromagnetic resonance and Brillouin light scattering investigations of magnetic properties of Co2MnGe Heusler thin films

URN to cite this document:

urn:nbn:de:bvb:355-epub-83199 Copy

DOI to cite this document:

10.5283/epub.8319 Copy

Belmeguenai, M. ; Zighem, F. ; Roussigné, Y. ; Chérif, S.-M. ; Moch, P. ; Westerholt, K. ; Woltersdorf, Georg ; Bayreuther, Günther

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Date of publication of this fulltext: 05 Aug 2009 13:59

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Details

Item type:	Article
Journal or Publication Title:	Physical Review B (PRB)
Publisher:	American Physical Society
Volume:	79
Number of Issue or Book Chapter:	2
Page Range:	024419
Date:	January 2009
Institutions:	Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Günther Bayreuther
Projects:	SFB 689: Spinphänomene in reduzierten Dimensionen
Identification Number:	Value Type 10.1103/PhysRevB.79.024419 DOI
Related URLs:	URL URL Type http://prb.aps.org/ UNSPECIFIED
Classification:	Notation Type 76.50.+g; 78.35.+c; 75.30.Gw; 75.40.Gb PACS
Keywords:	Brillouin spectra, cobalt alloys, crystal symmetry, ferromagnetic materials, ferromagnetic resonance, germanium alloys, magnetic anisotropy, magnetic thin films, magnetisation, magneto-optical effects, manganese alloys, metallic thin films, spin waves, sputtered coatings
Dewey Decimal Classification:	500 Science > 530 Physics
Status:	Published
Refereed:	Yes, this version has been refereed
Created at the University of Regensburg:	Partially
Item ID:	8319

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Abstract

Co2MnGe films of different thicknesses (34, 55, and 83 nm) were grown by rf sputtering at 400 °C on single-crystal Al2O3 corundum substrates showing an in-plane c axis. Their dynamic magnetic properties were studied using conventional and microstrip line (MS) ferromagnetic resonances (FMRs), as well as Brillouin light scattering (BLS) techniques. The effective magnetizations and gyromagnetic ...

Abstract

Co2MnGe films of different thicknesses (34, 55, and 83 nm) were grown by rf sputtering at 400 °C on single-crystal Al2O3 corundum substrates showing an in-plane c axis. Their dynamic magnetic properties were studied using conventional and microstrip line (MS) ferromagnetic resonances (FMRs), as well as Brillouin light scattering (BLS) techniques. The effective magnetizations and gyromagnetic factors are first deduced from the resonance spectra involving the uniform magnetic mode under in-plane and out-of-plane magnetic applied fields. The angular dependence of the frequency, measured under a weak in-plane magnetic applied field, then allows deriving of the parameters describing the in-plane magnetic anisotropy. In the 34- and 55-nm-thick films, its behavior is described assuming a magnetic energy density showing an orthorhombic symmetry with a twofold axis normal to the film and planar anisotropy axes at ±pi/4 of the c axis of the substrate; however, due to the comparative deduced values of the pertinent coefficients, this energy density is predominantly tetragonal. In the thickest film (83 nm), one of the planar anisotropy axes is parallel to c and approximate tetragonal symmetry is no more observed. Moreover, the orthorhombic symmetry is not completely fulfilled and a small misalignment between the principal directions connected to the uniaxial and the fourfold energy terms appears. Finally, the perpendicular surface standing modes, which are observed in MS-FMR and in BLS spectra, allow evaluation of the exchange stiffness constant. Good agreement between BLS and MS-FMR measurements has been found.

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