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Titova, Lyubov V., Cocker, Tyler L., Xu, Sijia, Baribeau, Jean-Marc, Wu, Xiaohua, Lockwood, David J. and Hegmann, Frank A. (2016) Ultrafast carrier dynamics and the role of grain boundaries in polycrystalline silicon thin films grown by molecular beam epitaxy. Semiconductor Science and Technology 31 (10), p. 105017. Fulltext not available.

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