Wutscher, Thorsten and Giessibl, Franz J.
Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy.
Review of Scientific Instruments 82 (2), 026106.
Other URL: http://dx.doi.org/doi/10.1063/1.3549628
We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.