Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.
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Other URL: http://dx.doi.org/doi/10.1063/1.3549628
We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.
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|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Projects:||SFB 689: Spinphänomene in reduzierten Dimensionen|
|Keywords:||atomic force microscopy; crystal faces; force sensors; image resolution; nickel compounds; specimen preparation;|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited On:||07 Sep 2011 08:31|
|Last Modified:||13 Mar 2014 17:57|