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Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy

Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.

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Other URL: http://dx.doi.org/doi/10.1063/1.3549628


We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.

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Item Type:Article
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:SFB 689: Spinphänomene in reduzierten Dimensionen
Identification Number:
06.60.Ei PACS
Keywords:atomic force microscopy; crystal faces; force sensors; image resolution; nickel compounds; specimen preparation;
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Deposited On:07 Sep 2011 08:31
Last Modified:13 Mar 2014 17:57
Item ID:22073
Owner Only: item control page


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