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Noncontact Atomic Force Microscopy: Volume 2

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy: Volume 2. NanoScience and Technology. Springer, Heidelberg, Berlin. ISBN Hardcover 978-3-642-01494-9; eBook ISBN 978-3-642-01495-6; Softcover ISBN: 978-3-642-26070-4.

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Abstract

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force ...

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Item type:Book
Date:2009
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Deposited on:05 Jul 2012 06:08
Last modified:08 Jun 2016 13:29
Item ID:25281
Owner only: item control page
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