Go to content
UR Home

Noncontact Atomic Force Microscopy. Band 2

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy. Band 2. Nanoscience and technology. Springer, Heidelberg, Berlin. ISBN 978-3-642-01494-9.

Full text not available from this repository.


Abstract

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force ...

plus


Export bibliographical data



Item Type:Book
Date:2009
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Deposited On:05 Jul 2012 06:08
Last Modified:20 May 2016 13:02
Item ID:25281
Owner Only: item control page
  1. Homepage UR

University Library

Publication Server

Contact person
Gernot Deinzer

Phone +49 941 943-2759
Contact