Deutsch
Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy. In: Siffert, Paul and Krimmel, E. F., (eds.) Silicon : evolution and future of a technology. Springer, Berlin, pp. 191-204. ISBN 3-540-40546-1.
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| Item Type: | Book Section |
|---|---|
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Keywords: | |
| Subjects: | 500 Science > 530 Physics |
| Status: | Published |
| Refereed: | Unknown |
| Created at the University of Regensburg: | Unknown |
| Owner: | Petra Wild |
| Deposited On: | 10 Jul 2012 16:25 |
| Last Modified: | 10 Jul 2012 16:25 |
| Item ID: | 25330 |
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